Zero Diffraction Plate with Cavity for XRD : 32 Dia x2.0 t mm w/ Cavity 10 IDx0.2 mm, Si Crystal

​The silicon material has different diffractions in X-rays regarding the crystalline orientation. If standard crystalline orientations such as (100) or (111) have important diffraction pics, there is a specific crystalline orientation with no diffraction on X-rays.

If a deposit putted down on a wafer with this kind of orientation is analyzed on X-rays, the diffraction pattern will have as origin, only the deposit. This support allows to achieve analysis on sensitive materials.

It has many kinds of this support named also silicon sample holder; some are flats and some others have a central cavity which allow to realize analysis on powders or liquids.


Specifications:
Crystal: Si (1 0 0), P-type B-doped
Resistivity:10-15 ohm.cm
Size: 32 mm diameter x 2.0 mm Thickness,with a cavity in the center of the plate with 10mm dia. and 0.2 mm depth
Zero diffraction plate is made of Silicon cut at special orientation
Perfect for sample holder of powder XRD, which has no background noise from 20 to 150 degree
  (2θ angle Cu Ka X-Ray)
Fit with XRD of PANalytical, BRUKER, Siemens, Rigaku and many more.
Typical XRD of Si zero plate

We are able to provide these Zero Background Holder as per specific request following your technical specification.